Noise Signatures of the Stress-Induced Breakdown Phenomena in GaAs/AlGaAs Heterostructure
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Published:2009-02-14
Issue:2
Volume:54
Page:692-696
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ISSN:0374-4884
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Container-title:Journal of the Korean Physical Society
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language:en
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Short-container-title:J. Korean Phy. Soc.
Author:
Kim Youngsang,Seo Yohan,Jeon Hankyung,Jeong Heejun
Publisher
Korean Physical Society
Subject
General Physics and Astronomy