A study on the Properties of Cu/SiOC(-H)/p-Si(100) and Cu/TaN/SiOC(-H)/p-Si(100) Interface
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Published:2009-11-14
Issue:5(1)
Volume:55
Page:1960-1964
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ISSN:0374-4884
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Container-title:Journal of the Korean Physical Society
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language:en
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Short-container-title:J. Korean Phy. Soc.
Author:
Choi Chi Kyu,Kim Chang Young,Navamathavan R.,Lee Heang Seuk,Yu Younghun,Woo Jong-Kwan
Publisher
Korean Physical Society
Subject
General Physics and Astronomy