Atomic Force Microscopy and Polarized Raman Spectroscopy of (GaP)n/(InP)n Short-Period Superlattice Structures-Reference-Cited by-同舟云学术

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Atomic Force Microscopy and Polarized Raman Spectroscopy of (GaP)n/(InP)n Short-Period Superlattice Structures

Published:2008-06-14 Issue:6 Volume:52 Page:1886-1890
ISSN:0374-4884
Container-title:Journal of the Korean Physical Society
language:en
Short-container-title:J. Korean Phy. Soc.

Author:

Lim Jung-Ran,Rho Heesuk,Song J. D.,Choi W. J.,Lee Y. T.

Publisher

Korean Physical Society

Subject

General Physics and Astronomy

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Electrical and Mechanical Properties of Polystyrene—Poly(methyl methacrylate) Blends;Journal of Advanced Physics;2015-09-01

2. Polarized Raman spectroscopy of corrugated MBE grown GaAs (6̄3̄1̄) homoepitaxial films;Journal of Crystal Growth;2013-09

3. Effect of thin intermediate-layer of InAs quantum dots on the physical properties of InSb films grown on (001) GaAs;Thin Solid Films;2012-08

4. Raman scattering studies of (GaP)n/(InP)n(n= 1, 1.7, 2) short-period superlattice structures;Journal of Raman Spectroscopy;2009-09

5. Domain Structures on PS-PMMA Mixture Films;Journal of the Korean Physical Society;2009-02-14

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