Validity of Film-Thickness Estimates Based on Angle-Resolved X-ray Photoelectron Spectroscopy Using Various Inelastic Mean-Free-Path Formulae
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Published:2007-12-15
Issue:6
Volume:51
Page:1915
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ISSN:0374-4884
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Container-title:Journal of the Korean Physical Society
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language:en
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Short-container-title:J. Korean Phys. Soc.
Author:
Lee Hangil,Kim Sehun,Lee Dohyun,Hwang Chanyong
Publisher
Korean Physical Society
Subject
General Physics and Astronomy