Effect of Rapid Thermal Annealing on a Ti/Au Ohmic Contact to n-ZnO-Reference-Cited by-同舟云学术

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Effect of Rapid Thermal Annealing on a Ti/Au Ohmic Contact to n-ZnO

Published:2008-07-15 Issue:1 Volume:53 Page:335-338
ISSN:0374-4884
Container-title:Journal of the Korean Physical Society
language:en
Short-container-title:J. Korean Phy. Soc.

Author:

Kim J. H.,Moon J. Y.,Lee H. S.,Ahn C. H.,Cho H. K.,Lee J. Y.,Kim H. S.

Publisher

Korean Physical Society

Subject

General Physics and Astronomy

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Ultraviolet photodetectors based on MgZnO thin films;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;2011-05

2. Effect of thermal annealing on Ni/Au contact to a-InGaZnO films deposited by dc sputtering;Thin Solid Films;2010-09

3. Microstructural investigation of Ti/Au ohmic contacts on Ga doped single crystalline n-ZnO films;Materials Science and Engineering: B;2010-02

4. Al/Au ohmic contact to n-ZnO by dc sputtering;Materials Science and Engineering: B;2009-11

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