Lattice distortion analysis of nonpolar a-plane $$(11\bar 20)$$ GaN films by using a grazing-incidence X-ray diffraction technique-Reference-Cited by-同舟云学术

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Lattice distortion analysis of nonpolar a-plane $$(11\bar 20)$$ GaN films by using a grazing-incidence X-ray diffraction technique

Published:2015-02 Issue:4 Volume:66 Page:607-611
ISSN:0374-4884
Container-title:Journal of the Korean Physical Society
language:en
Short-container-title:Journal of the Korean Physical Society

Author:

Seo Yong Gon,Kim Jihoon,Hwang Sung-Min,Kim Jihyun,Jang Soohwan,Kim Heesan,Baik Kwang Hyeon

Publisher

Korean Physical Society

Subject

General Physics and Astronomy

Link

http://link.springer.com/content/pdf/10.3938/jkps.66.607.pdf

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Evaluation of Photoconversion Efficiency in InGaN/GaN MQW Solar Cells at High Temperatures;ACS Applied Energy Materials;2023-08-15

2. Impact of sandwiched strain periodic multilayer AlN/GaN on strain and crystalline quality of a-plane GaN;Scientific Reports;2021-05-06

3. Ohmic Contact Properties of Photo-Chemically Etched Nonpolar A-Plane GaN Films;ECS Journal of Solid State Science and Technology;2017

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