Vehicle Components Defect Detection via Machine Vision-Reference-Cited by-同舟云学术

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Vehicle Components Defect Detection via Machine Vision

Published:2020-12-25 Issue: Volume: Page:131-137
ISSN:2579-2784
Container-title:Mathematical Problems of Computer Science
language:en
Short-container-title:

Author:

Petrosyan Armen¹

Affiliation:

1. Institute for Informatics and Automation Problems of NAS RA

Abstract

The task of quality control and automatic defect detection on production lines is one of the most important tasks of machine vision and digital image processing (DIP). This article provides one example of solving such a problem using various DIP algorithms.

Publisher

Institute for Informatics and Automation Problems - NAS RA

Subject

General Medicine

Reference6 articles.

1. National Instruments LabVIEW Development System, www.ni.com.

2. A. K. Jain, Fundamentals of Digital Image Processing, Prentice-Hall Inc, Englewood Cliffs, 1989.

3. National Instruments Corporation, “NI Vision Concepts Manual”, 2000-2009.

4. E. R. Davies, Computer and Machine Vision: Theory, Algorithms, Practicalities, 4th Edition, ELSEVIER, 2012.

5. A. Petrosyan, “Infrared image processing for solar cell defect detection”, Proceedings of International Conference Computer Science and Information Technologies, pp. 300—304, 2017.

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