Systemic Root Cause Early Failure Analysis during Accelerated Reliability Testing of Mass Produced Mobility Electronics
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Published:2016-04-05
Issue:3
Volume:9
Page:534-544
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ISSN:1946-3987
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Container-title:SAE International Journal of Materials and Manufacturing
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language:en
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Short-container-title:SAE Int. J. Mater. Manf.
Author:
Verbitsky David E.
Publisher
SAE International
Cited by
1 articles.
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