The Depth Limits of Eddy Current Testing for Defects: A Computational Investigation and Smooth-Shaped Defect Synthesis from Finite Element Optimization
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Published:2015-04-14
Issue:2
Volume:8
Page:450-457
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ISSN:1946-3987
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Container-title:SAE International Journal of Materials and Manufacturing
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language:en
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Short-container-title:SAE Int. J. Mater. Manf.
Author:
Mathialakan T.,Karthik V. U.,Jayakumar Paramsothy,Thyagarajan Ravi,Hoole S. Ratnajeevan H.
Publisher
SAE International