Measurement of the Particle Current Changes Associated with the Flatness of Deflector Mesh Surface in Particle Beam Mass Spectrometer System-Reference-Cited by-同舟云学术

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Measurement of the Particle Current Changes Associated with the Flatness of Deflector Mesh Surface in Particle Beam Mass Spectrometer System

Published:2016-03-30 Issue:2 Volume:25 Page:25-27
ISSN:2288-6559
Container-title:Applied Science and Convergence Technology
language:en
Short-container-title:Applied Science and Convergence Technology

Author:

Kim Dongbin,Kim TaeWan,Jin Yinhua,Mun Jihun,Lim In-Tae,Kim Ju-Hwang,Kim Taesung,Kang Sang-Woo

Publisher

The Korean Vacuum Society

Subject

Electrical and Electronic Engineering,Physical and Theoretical Chemistry,Condensed Matter Physics,Materials Science (miscellaneous)

Link

http://ocean.kisti.re.kr/downfile/crosscheck/kvs/JAKO201612461131271.pdf

Reference7 articles.

1. Particle beam mass spectrometry of submicron particles charged to saturation in an electron beam

2. Particle beam mass spectrometer measurements of particle formation during low pressure chemical vapor deposition of polysilicon and SiO2 films

3. Aerodynamic Focusing of Nanoparticles: I. Guidelines for Designing Aerodynamic Lenses for Nanoparticles

4. Generating Particle Beams of Controlled Dimensions and Divergence: I. Theory of Particle Motion in Aerodynamic Lenses and Nozzle Expansions

5. Electron Impact Charging Properties of Size-Selected, Submicrometer Organic Particles

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