Thin Film Characterization via Synchrotron X-ray Experiments: XRR-TXRF, GIWAXS, 3D RSM
Author:
Affiliation:
1. Department of Organic Material Science and Engineering, School of Chemical Engineering, Pusan National University, Busan 46241, Republic of Korea
Funder
National Research Foundation of Korea
Korea Electric Power Corporation
Ministry of Science and ICT
Publisher
The Korean Vacuum Society
Subject
Electrical and Electronic Engineering,Physical and Theoretical Chemistry,Condensed Matter Physics,Materials Science (miscellaneous),General Medicine
Link
http://pdf.medrang.co.kr/ASCT/2022/031/ASCT031-06-128.pdf
Reference14 articles.
1. Atomic interdiffusion in Pt-Ni thin films at low temperatures: An in-situ X-ray reflectivity study
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3. Effect of Sr Content and Strain on Sr Surface Segregation of La1–xSrxCo0.2Fe0.8O3−δ as Cathode Material for Solid Oxide Fuel Cells
4. In situ characterization of strontium surface segregation in epitaxial La0.7Sr0.3MnO3 thin films as a function of oxygen partial pressure
5. GIWAXS Analysis on Preferred Orientation in Metal Halide Perovskite Films Via Alkylamines
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