High-Resolution X-Ray Photoelectron Spectroscopy Study of a Sb2Te3Thin Film with the Polycrystalline Phase-Reference-Cited by-同舟云学术

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High-Resolution X-Ray Photoelectron Spectroscopy Study of a Sb2Te3Thin Film with the Polycrystalline Phase

Published:2012-11-30 Issue:6 Volume:21 Page:348-353
ISSN:1225-8822
Container-title:Journal of the Korean Vacuum Society
language:en
Short-container-title:Journal of the Korean Vacuum Society

Author:

Lee Y.M.,Kim K.,Shin H.J.,Jung M.C.,Qi Y.

Publisher

The Korean Vacuum Society

Subject

Electrical and Electronic Engineering,Physical and Theoretical Chemistry,Condensed Matter Physics,Materials Science (miscellaneous)

Link

http://ocean.kisti.re.kr/downfile/crosscheck/kvs/JAKO201201052163423.pdf

Reference20 articles.

1. Rapid‐phase transitions of GeTe‐Sb2Te3pseudobinary amorphous thin films for an optical disk memory

2. Understanding the phase-change mechanism of rewritable optical media

3. Characterization of nitrogen-doped Sb2Te3 films and their application to phase-change memory

4. Crystallization characteristics of nitrogen-doped Sb2Te3 films for PRAM application

5. High-resolution x-ray photoelectron spectroscopy on oxygen-free amorphous Ge2Sb2Te5

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Formation of Threshold Switching Chalcogenide for Phase Change Switch Applications;Applied Science and Convergence Technology;2014-01-30

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