Author:
Li Shaoying,Chen Na,Liu Zhenmin,Liu Shupeng,Shang Yana,Liu Yong,Chen Zhenyi,Pang Fufei,Wang Tingyun
Abstract
This study proposes an optical scanning thermal imaging method for micro-nanoscale thermal characterization utilizing a near-field fiber optic probe with CdSe quantum dots, validated through in-situ measurement of bond wire temperature distribution.