Resonant soft x-ray reflectivity of Me/B_4C multilayers near the boron K edge
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Publisher
The Optical Society
Reference14 articles.
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1. Resonant soft X-ray reflectivity of ultrathin polymer films at the C-edge: A direct approach;AIP Advances;2016-09
2. Element-specific structural analysis of Si/B4C using resonant X-ray reflectivity;Journal of Applied Crystallography;2015-05-09
3. Chemical selective microstructural analysis of thin film using resonant x-ray reflectivity;Journal of Applied Physics;2013-07-14
4. Spectral properties of La/B - based multilayer mirrors near the boron K absorption edge;Optics Express;2012-05-09
5. A setup for probing ultra-short soft X-ray diffraction by means of curved multilayer structures;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2011-10
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