Author:
Hussey Daniel S.,Daugherty M. Cyrus,Kim Youngju,Jacobson David L.,LaManna Jacob M.,Bajcsy Peter,Sathe Pushkar,Klimov Nikolai N.,Robinson Sarah M.,Murphy Ryan P.,Wolf Caitlyn M.,Kienzle Paul A.,Huber Michael G.,Thomas Nicholas E.,Speegle Chet O.,Weigandt Katie M.
Abstract
We discuss instrumentation and analysis efforts at NIST to develop neutron dark-field imaging, simultaneous neutron/X-ray tomography and the Wolter optics neutron microscope. Progress will be highlighted through applications in electrochemistry, advanced manufacturing, concrete, and geology.