Live Demonstration of ML-based PON Characterization and Monitoring
Author:
Brügge Maximilian,Müller Jasper,Patri Sai Kireet,Jansen Sander,Zou Jim,Althoff Stephanie,Förster Klaus-Tycho
Abstract
We demonstrate a machine learning-based solution for optical time-domain reflectometry devices which can assist in the classification and monitoring of reflective events in a passive optical network.
Publisher
Optica Publishing Group
Reference2 articles.
1. Event-Detection Deep Neural Network for OTDR Trace Analysis;Rutigliano,2021