Location of hot spots in integrated circuits by monitoring the substrate thermal-phase lag with the mirage effect-Reference-Cited by-同舟云学术

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Location of hot spots in integrated circuits by monitoring the substrate thermal-phase lag with the mirage effect

Published:2010-07-30 Issue:15 Volume:35 Page:2657
ISSN:0146-9592
Container-title:Optics Letters
language:en
Short-container-title:Opt. Lett.

Author:

Perpiñà Xavier,Altet Josep,Jordà Xavier,Vellvehi Miquel,Mestres Narcís

Funder

Consejo Superior de Investigaciones Científicas

Spanish Ministry of Science and Innovation

Publisher

The Optical Society

Subject

Atomic and Molecular Physics, and Optics

Reference10 articles.

1. Thermal Modeling, Analysis, and Management in VLSI Circuits: Principles and Methods

2. Impact of Thermal Gradients on Clock Skew and Testing

3. Statistical Thermal Profile Considering Process Variations: Analysis and Applications

4. Dynamic Surface Temperature Measurements in ICs

5. Localisation of devices acting as heat sources in ICs covered entirely by metal layers

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