Author:
Balakrishnan Deepan,Chee See Wee,Bosman Michel,Loh Duane
Abstract
We propose a novel coherent imaging method for the 3D-reconstruction of nanomaterials from a single HRTEM micrograph. This method determines the thickness and depth maps from overlapping sub-patches within a micrograph’s absorption and phase contrast.
Cited by
1 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献