Ellipsometry for Modulated Reflection Studies of Surfaces*
Author:
Publisher
The Optical Society
Subject
General Engineering
Reference11 articles.
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1. Modulated photoellipsometry: Application to the measurement of GaAs internal field;Physica Status Solidi (a);1995-11-16
2. Ellipsometric studies on Cd1−xMnxTe thin films under the influence of HeNe laser and small alternating magnetic fields;Journal of Applied Physics;1995-11
3. Modulated ellipsometry for characterization of multiple quantum wells and superlattices;Thin Solid Films;1993-10
4. Photoellipsometry: a modulation spectroscopy method applied to n-type GaAs;Thin Solid Films;1993-10
5. Spectroscopic ellipsometry under external excitation;Thin Solid Films;1993-10
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