Achieving a given reflectance for unpolarized light by controlling the incidence angle and the thickness of a transparent thin film on an absorbing substrate: application to energy equipartition in the four-detector photopolarimeter
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Publisher
The Optical Society
Reference5 articles.
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Cited by 3 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Porosity engineering in glancing angle deposition thin films;Applied Physics A;2005-02
2. Effect of light-beam deviation on the instrument matrix of the four-detector photopolarimeter;Optical Engineering;1997-03-01
3. Development of a novel ellipsometer based on a four-detector photopolarimeter;Thin Solid Films;1994-06
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