Geometry for contouring by electronic speckle pattern interferometry based on shifting illumination beams-Reference-Cited by-同舟云学术

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Geometry for contouring by electronic speckle pattern interferometry based on shifting illumination beams

Published:1992-11-01 Issue:31 Volume:31 Page:6616
ISSN:0003-6935
Container-title:Applied Optics
language:en
Short-container-title:Appl. Opt.

Author:

Zou Y.,Diao H.,Peng X.,Tiziani H.

Publisher

The Optical Society

Reference2 articles.

1. Contouring by electronic speckle pattern interferometry employing dual beam illumination

Cited by 19 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Real-time contour fringes obtained with a variable synthetic wavelength from a single diode laser;Applied Physics B;2014-12-04

2. From speckle pattern photography to digital holographic interferometry [Invited];Applied Optics;2012-12-21

3. Shape measurement of diffuse and transparent objects by two wavelength contouring using phase retrieval;Modeling Aspects in Optical Metrology II;2009-06-15

4. Shape and deformation measurements of 3D objects using volume speckle field and phase retrieval;Optics Letters;2009-05-08

5. Surface shape measurement by phase-shifting digital holography with dual wavelengths;Interferometry XIII: Techniques and Analysis;2006-08-14

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