High-resolution 3D shape measurement with extended depth of field using fast chromatic focus stacking

Abstract

Close-range 3D sensors based on the structured light principle have a constrained measuring range due to their depth of field (DOF). Focus stacking is a method to extend the DOF. The additional time to change the focus is a drawback in high-speed measurements. In our research, the method of chromatic focus stacking was applied to a high-speed 3D sensor with 180 fps frame rate. The extended DOF was evaluated by the distance-dependent 3D resolution derived from the 3D-MTF of a tilted edge. The conventional DOF of 14 mm was extended to 21 mm by stacking two foci at 455 and 520 nm wavelength. The 3D sensor allowed shape measurements with extended DOF within 44 ms.