Comparison of methods for determining the second-order detection efficiency of a VUV spectrometer
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Publisher
The Optical Society
Reference9 articles.
1. Calibration of a VUV spectrometer–detector system using synchrotron radiation
2. Thin Films and Their Uses for the Extreme Ultraviolet
3. Unfolding first and second order diffracted radiation when using synchrotron radiation sources: a technique
4. Synchrotron radiation intensity for 50-MeV to 50-GeV electrons
5. Use of a scaling relationship for synchrotron radiation
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1. Measurement of the second-order spectral diffraction efficiency of polarized dual-grating spectrometers;Optik;2019-02
2. The second order diffraction efficiency measurements in the vacuum ultraviolet;Optics Express;2009-07-17
3. Photometric calibration of the first three spectroscopic orders of an extreme-ultraviolet spectrometer by use of synchrotron radiation;Applied Optics;1994-07-01
4. Higher order contributions in the synchrotron radiation spectrum of a toroidal grating monochromator determined by the use of a transmission grating;Review of Scientific Instruments;1989-07
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