Digital Hilbert transformation for separation measurement of thicknesses and refractive indices of layered objects by use of a wavelength-scanning heterodyne interference confocal microscope
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Publisher
The Optical Society
Reference16 articles.
1. Simultaneous measurement of thicknesses and refractive indices of multiple layers by a low-coherence confocal interference microscope
2. Simultaneous measurement of the phase and group indices and the thickness of transparent plates by low-coherence interferometry
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4. Separation of measurement of the refractive index and the geometrical thickness by use of a wavelength-scanning interferometer with a confocal microscope
5. Geometrical cross-sectional imaging by a heterodyne wavelength-scanning interference confocal microscope
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