Author:
Ornelas-Skarin C.,Bezriadina T.,Fuchs M.,Ghimire S.,Hastings J. B.,Hua N. N.,Leroy L.,Nguyen Q.,de la Peña G.,Popova-Gorelova D.,Shwartz S.,Trigo M.,Sato T.,Zhu D.,Reis D. A.
Abstract
We present recent measurements of nonlinear x-ray optical mixing in silicon. These measurements demonstrate how x-ray optical mixing can measure details of the atomic-scale nonlinear electron dynamics that are invisible to purely optical techniques.