Two-color light-emitting-diode source for high-precision phase-shifting interferometry
Author:
Publisher
The Optical Society
Subject
Atomic and Molecular Physics, and Optics
Reference7 articles.
1. Development of a Three-Dimensional Noncontact Digital Optical Profiler
2. Two-wavelength phase shifting interferometry
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1. Improved Least Common Multiple Effective Wavelength Method Used in Dual-Wavelength Interferometry;Laser & Optoelectronics Progress;2021
2. Correction of illumination fluctuations in phase-shifting technique by use of fringe histograms;Applied Optics;2015-12-24
3. Interference Microscopy for Surface Structure Analysis;Handbook of Optical Metrology;2015-04-02
4. Principles of interference microscopy for the measurement of surface topography;Advances in Optics and Photonics;2015-02-02
5. Fourier description of the phase-measuring process in two-wavelength phase-shifting interferometry;Optics Communications;1997-04
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