Characterization and modeling of drift noise in Fourier transform spectroscopy: implications for signal processing and detection limits
Author:
Publisher
The Optical Society
Reference11 articles.
1. The Multiplex Disadvantage and Excess Low-Frequency Noise
2. Characterization of Frequency Stability
3. Signal-to-Noise Ratio Characteristics of an Inductively Coupled Plasma/Fourier Transform Spectrometer
4. Fractional Brownian Motions, Fractional Noises and Applications
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