Characterization of sputtered nickel/carbon multilayers with soft-x-ray reflectivity measurements
Author:
Publisher
The Optical Society
Reference14 articles.
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1. X-ray broadband Ni/SiC multilayers: improvement with W barrier layers;Optics Express;2014-10-14
2. Advanced nanometer-size structures;Acta Physica Slovaca. Reviews and Tutorials;2007-12-01
3. Ultrashort period Cu/Si and Ni/C multilayers for X-ray mirrors;Zeitschrift für Kristallographie Supplements;2006-06
4. Fabrication of multilayer mirrors consisting of oxide and nitride layers for continual use across the K-absorption edge of carbon;Applied Optics;2004-03-19
5. Figure Error Correction by Reflection Wavefront Control of Cu Kα Grazing Incidence Multilayer Mirrors;Optical Review;2003-09
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