Spectroscopic studies of Si v and Si vI between 500 and 1300 Å using the beam-foil method*
Author:
Publisher
The Optical Society
Subject
General Engineering
Reference7 articles.
1. Oscillator Strengths for Resonance Lines of Ions in the Neon Isoelectronic Sequence
2. Analysis of the 2p53s, 3p, 3dand 4sConfigurations of Quadruply Ionized Silicon (Si V)
3. Radiative-lifetime measurements in Si II-Si V
4. Beam-foil lifetime measurements of nitrogen in the vacuum ultraviolet spectral range
5. Lifetime Measurements in Fluorine and Silicon in the Vacuum Ultraviolet
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2. Weighted oscillator strengths for Si V spectrum;Journal of Quantitative Spectroscopy and Radiative Transfer;1996-11
3. Lifetime measurements of some 2p53p and 2p53d levels in Ne-like Cr XV and Fe XVII;Physica Scripta;1996-01-01
4. Lifetimes of 2p53p and 3d levels in Ne-like chlorine, Cl VIII;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1988-04
5. Atomic data and spectral line intensities for the neon isoelectronic sequence (Si V through Kr XXVII);Atomic Data and Nuclear Data Tables;1985-05
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