Dependence of transverse and longitudinal resolutions on incident Gaussian beam widths in the illumination part of optical scanning microscopy-Reference-Cited by-同舟云学术

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Dependence of transverse and longitudinal resolutions on incident Gaussian beam widths in the illumination part of optical scanning microscopy

Published:2007-01-01 Issue:1 Volume:24 Page:60
ISSN:1084-7529
Container-title:Journal of the Optical Society of America A
language:en
Short-container-title:J. Opt. Soc. Am. A

Author:

Chon Hyung-Su,Park Gisung,Lee Sang-Bum,Yoon Seokchan,Kim Jaisoon,Lee Jai-Hyung,An Kyungwon

Publisher

The Optical Society

Subject

Computer Vision and Pattern Recognition,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference12 articles.

1. Changes in the characteristics of a Gaussian beam weakly diffracted by a circular aperture

2. Electromagnetic diffraction in optical systems - I. An integral representation of the image field

3. Electromagnetic diffraction in optical systems, II. Structure of the image field in an aplanatic system

4. Certain computational aspects of vector diffraction problems

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