Quadrature laser interferometer for in-line thickness measurement of glass panels using a current modulation technique-Reference-Cited by-同舟云学术

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Quadrature laser interferometer for in-line thickness measurement of glass panels using a current modulation technique

Published:2014-07-10 Issue:20 Volume:53 Page:4604
ISSN:1559-128X
Container-title:Applied Optics
language:en
Short-container-title:Appl. Opt.

Author:

Kim Jong-Ahn,Kang Chu-Shik,Eom Tae Bong,Jin Jonghan,Suh Ho Suhng,Kim Jae Wan

Funder

Ministry of Trade, Industry & Energy

Publisher

The Optical Society

Subject

Atomic and Molecular Physics, and Optics,Engineering (miscellaneous),Electrical and Electronic Engineering

Reference10 articles.

1. On-line measurement of the thickness and optical quality of float glass with a sensor based on a diffractive element

2. Simultaneous measurement of refractive index and thickness by combining low-coherence interferometry and confocal optics

3. Heterodyne double-channel polarimeter for mapping birefringence and thickness of flat glass panels

4. Differential heterodyne interferometer for measuring thickness of glass panels

5. Application of the astigmatic method to the thickness measurement of glass substrates

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