Denoising and extracting background from fringe patterns using midpoint-based bidimensional empirical mode decomposition-Reference-Cited by-同舟云学术

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Denoising and extracting background from fringe patterns using midpoint-based bidimensional empirical mode decomposition

Published:2014-03-18 Issue:10 Volume:53 Page:B215
ISSN:1559-128X
Container-title:Applied Optics
language:en
Short-container-title:Appl. Opt.

Author:

Wielgus Maciej,Patorski Krzysztof

Funder

Foundation For Polish Science (FNP)

Publisher

The Optical Society

Subject

Atomic and Molecular Physics, and Optics,Engineering (miscellaneous),Electrical and Electronic Engineering

Reference28 articles.

1. Advanced evaluation techniques in interferometry;SchwiderWolf,1990

2. Information retrieval from amplitude modulated fringe patterns using single frame processing methods

3. Windowed Fourier transform for fringe pattern analysis

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