Affiliation:
1. Université Paris Cité
2. Saints-Pères Paris Institute for the Neurosciences
3. Institut Universitaire de France (IUF)
Abstract
In astronomy or biological imaging, refractive index inhomogeneities of, e.g., atmosphere or tissues, induce optical aberrations that degrade the desired information hidden behind the medium. A standard approach consists of measuring these aberrations with a wavefront sensor (e.g., Shack–Hartmann) located in the pupil plane, and compensating for them either digitally or by adaptive optics with a wavefront shaper. However, in its usual implementation this strategy can only extract aberrations within a single isoplanatic patch, i.e., a region where the aberrations remain correlated. This limitation severely reduces the effective field-of-view in which the correction can be performed. Here, we propose a wavefront sensing method capable of measuring, in a single shot, various pupil aberrations corresponding to multiple isoplanatic patches. The method, based on a thin diffuser (i.e., a random phase mask), exploits the dissimilarity between different speckle regions to multiplex several wavefronts incoming from various incidence angles. We present proof-of-concept experiments carried out in widefield fluorescence microscopy. A digital deconvolution procedure in each isoplanatic patch yields accurate aberration correction within an extended field-of-view. This approach is of interest for adaptive optics applications as well as diffractive optical tomography.
Funder
DIM ELICIT-Region Ile de France
Société d’Accélération du Transfert de Technologies
Agence Nationale de la Recherche