Computing aberration coefficients for plane-symmetric reflective systems: a Lie algebraic approach

Author:

Barion A.ORCID,Anthonissen M. J. H.,ten Thije Boonkkamp J. H. M.,IJzerman W. L.1

Affiliation:

1. Signify

Abstract

We apply the Lie algebraic method to reflecting optical systems with plane-symmetric freeform mirrors. Using analytical ray-tracing equations, we construct an optical map. The expansion of this map gives us the aberration coefficients in terms of initial ray coordinates. The Lie algebraic method is applied to treat aberrations up to arbitrary order. The presented method provides a systematic and rigorous approach to the derivation, treatment, and composition of aberrations in plane-symmetric systems. We give the results for second- and third-order aberrations and apply them to three single-mirror examples.

Funder

Topconsortium voor Kennis en Innovatie

Publisher

Optica Publishing Group

Subject

Computer Vision and Pattern Recognition,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Cited by 1 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Lie algebraic methods for aberrations of plane-symmetric mirror systems;International Optical Design Conference 2023;2023-09-14

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