Relationship between the p and s Fresnel reflection coefficients of an interface independent of angle of incidence
Author:
Publisher
The Optical Society
Subject
Computer Vision and Pattern Recognition,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference5 articles.
1. Direct relation between Fresnel’s interface reflection coefficients for the parallel and perpendicular polarizations
2. Relations between amplitude reflectances and phase shifts of the p and s polarizations when electromagnetic radiation strikes interfaces between transparent media
3. Definitions and conventions in ellipsometry
4. Simple and direct determination of complex refractive index and thickness of unsupported or embedded thin films by combined reflection and transmission ellipsometry at 45° angle of incidence
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