Detection of subwavelength slit-width variation with irradiance measurements in the far field
Author:
Publisher
The Optical Society
Subject
Atomic and Molecular Physics, and Optics
Reference7 articles.
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5. Near-field diffraction by a slit in a thick perfectly conducting screen flying above a magneto-optical disk
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1. Characterization of one-dimension edge roughness from far-field irradiance at subwavelength-scale precision;Optics Communications;2008-04
2. Laser Characterization of the Periodic Line-Space Micro/Nano Structures;2007 30th International Spring Seminar on Electronics Technology (ISSE);2007-05
3. Retrieving two-dimensional information of the subwavelength variation from far-field irradiance;Journal of the Optical Society of America A;2006-10-01
4. Characterization of subwavelength-scale marginal roughness from far-field irradiance;Frontiers in Optics;2006
5. Identifying the subwavelength-aperture-width variation in the far field with tunable asymmetrically-embedded-aperture interferometer configuration;Journal of the Optical Society of America A;2005-08-01
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