Fabrication and characterization of a silicon cantilever probe with an integrated quartz-glass (fused-silica) tip for scanning near-field optical microscopy-Reference-Cited by-同舟云学术

Fabrication and characterization of a silicon cantilever probe with an integrated quartz-glass (fused-silica) tip for scanning near-field optical microscopy

Published:2001-10-01 Issue:28 Volume:40 Page:5040
ISSN:0003-6935
Container-title:Applied Optics
language:en
Short-container-title:Appl. Opt.

Author:

Schürmann Gregor,Noell Wilfried,Staufer Urs,de Rooij Nico F.,Eckert Rolf,Freyland Jan M.,Heinzelmann Harry

Publisher

The Optical Society

Reference24 articles.

1. XXXVIII.A suggested method for extending microscopic resolution into the ultra-microscopic region

2. Resolving Power of Visible Light

3. Optical stethoscopy: Image recording with resolution λ/20

4. Breaking the Diffraction Barrier: Optical Microscopy on a Nanometric Scale

5. Combined shear force and near‐field scanning optical microscopy

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