Affiliation:
1. TRUMPF Laser GmbH
2. Münster University of Applied Sciences
3. Stuttgart University
Abstract
Stress-induced birefringence leads to losses in solid-state laser resonators and
amplifiers with polarized output beams. A model of stress-induced
birefringence in thin disks is presented, as well as measurements of
stress-induced birefringence in a thin disk in a multi-kilowatt
oscillator. A full-Stokes imaging polarimeter was developed to enable
fast and accurate polarimetric measurements. Experimental and
simulated results are in good agreement qualitatively and
quantitatively and show that the polarization loss due to
stress-induced birefringence is negligible for ytterbium-doped thin
disks with a thickness around 100 µm but becomes relevant in thicker
disks. It is concluded that stress-induced birefringence should be
taken into consideration when designing a thin-disk laser system.
Subject
Atomic and Molecular Physics, and Optics,Engineering (miscellaneous),Electrical and Electronic Engineering
Cited by
1 articles.
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