Abstract
Anisotropy reveals interesting details of the subsurface structure of a material. We aim at noninvasive assessment of material anisotropy using as few measurements as possible. To this end, we evaluate different methods for detecting anisotropy when observing (1) several sample rotations, (2) two perpendicular planes of incidence, and (3) just one observation. We estimate anisotropy by fitting ellipses to diffuse reflectance isocontours, and we assess the robustness of this method as we reduce the number of observations. In addition, to support the validity of our ellipse fitting method, we propose a machine learning model for estimating material anisotropy.
Funder
Innovationsfonden
Villum Fonden
Horizon 2020 Framework Programme
Subject
Electronic, Optical and Magnetic Materials