Author:
Emmert Luke A.,Rudolph Wolfgang,Zarkesh-Ha Payman,Schmucker Landon,Jalouli Alireza,Gruzdev Vitaly
Abstract
Noise characterization is extremely important for numerous applications of ultrafast laser interactions with metal-semiconductor-metal nanostructures. Here we report noise characterization of the structures with GaN and GaAs performed by ultrafast-optical and traditional electronic approaches.