Author:
McVay E.,Deri R.J.,Mittelberger D.,Fenwick W.E.,Baxamusa S.,Boisselle M.C.,Li J.,Varley J.,Swertfeger R.,Gilmore L.,Crowley M.,Thiagarajan P.,Song J.,Thaler G.
Abstract
Laser Beam Induced Current Spectroscopy (LBIC) is used to identify failure locations during aging of ~800 nm broad area laser diodes. The magnitude of the spatially integrated LBIC signal is correlated with the threshold current.