Area modulation grating for sinusoidal structure illumination on phase-measuring profilometry-Reference-Cited by-同舟云学术

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Area modulation grating for sinusoidal structure illumination on phase-measuring profilometry

Published:2001-03-10 Issue:8 Volume:40 Page:1201
ISSN:0003-6935
Container-title:Applied Optics
language:en
Short-container-title:Appl. Opt.

Author:

Xian Tao,Su Xianyu

Publisher

The Optical Society

Reference15 articles.

1. Overview of three-dimensional shape measurement using optical methods

2. Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry

3. Fourier transform profilometry for the automatic measurement of 3-D object shapes

4. Error caused by sampling in Fourier transform profilometry

5. Two-dimensional color Schlieren system

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