Phase topography-based characterization of thermal effects on materials and joining techniques
Author:
Funder
EU
Publisher
The Optical Society
Subject
Atomic and Molecular Physics, and Optics,Engineering (miscellaneous),Electrical and Electronic Engineering
Reference16 articles.
1. Ultra-high accuracy thermal expansion measurements with PTB's precision interferometer
2. Dimensional stability: an overview
3. Long-term stability of optical surfaces
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