Use of the biased estimator in the interpretation of spectroscopic ellipsometry data
Author:
Publisher
The Optical Society
Reference14 articles.
1. Optical absorption of silicon between 1.6 and 4.7 eV at elevated temperatures
2. Dielectric functions and optical parameters of Si, Ge, GaP, GaAs, GaSb, InP, InAs, and InSb from 1.5 to 6.0 eV
3. Optical Properties of the Interface between Si and Its Thermally Grown Oxide
4. Spectroscopic ellipsometry: A new tool for nondestructive depth profiling and characterization of interfaces
5. Investigation of effective-medium models of microscopic surface roughness by spectroscopic ellipsometry
Cited by 105 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Investigation on universal tool wear measurement technique using image-based cross-correlation analysis;Measurement;2021-02
2. Large-Scale characterization of Two-Dimensional Monolayer MoS2 Island Domains Using Spectroscopic Ellipsometry and Reflectometry;Applied Surface Science;2020-09
3. Analytic solutions for calculating the surface inclination of isotropic media and bare substrates by using reflection-based generalized ellipsometry;Journal of Vacuum Science & Technology B;2020-05
4. Some aspects on the uncertainty calculation in Mueller ellipsometry;Optics Express;2020-03-05
5. Polymethyl methacrylate: Optical properties from 191 to 1688 nm (0.735–6.491 eV) by spectroscopic ellipsometry;Surface Science Spectra;2020-01-22
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3