Stress, scatter, and structure dependence on composition of thin films of Si–YF_3 and ZnSe–SrF

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Stress, scatter, and structure dependence on composition of thin films of Si–YF_3 and ZnSe–SrF_2

Published:1991-02-01 Issue:4 Volume:30 Page:495
ISSN:0003-6935
Container-title:Applied Optics
language:en
Short-container-title:Appl. Opt.

Author:

Sankur Haluk O.,DeNatale Jeff,Gunning William J.

Publisher

The Optical Society

Reference6 articles.

1. Evaporated Inhomogeneous Thin Films

2. Effective medium models for the optical properties of inhomogeneous materials

3. Intrinsic stress and structural properties of mixed composition thin films

4. Sorbed water and intrinsic stress in composite TiO2‐SiO2films

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