Polarimetric characterization of bismuth thin films deposited by laser ablation-Reference-Cited by-同舟云学术

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Polarimetric characterization of bismuth thin films deposited by laser ablation

Published:2012-12-13 Issue:36 Volume:51 Page:8549
ISSN:1559-128X
Container-title:Applied Optics
language:en
Short-container-title:Appl. Opt.

Author:

Espinosa-Luna Rafael,Camps Enrique,Cardona Dagoberto,De la Rosa Elder

Funder

CONACYT

European Community Seven Framework Programme

Publisher

The Optical Society

Subject

Atomic and Molecular Physics, and Optics,Engineering (miscellaneous),Electrical and Electronic Engineering

Reference29 articles.

1. Optical properties of crystalline and amorphous bismuth films

2. Band Structure of Bismuth: Pseudopotential Approach

3. Optical Properties and Band Structure of Group IV-VI and Group V Materials

4. Optical Properties of Antimony and Bismuth Crystals

5. Optical Properties of Antimony and Bismuth in the Far Ultraviolet

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1. Thin Ag/Bi coatings as epsilon-near-zero material with low optical losses;Optical Materials;2022-02

2. Fresnel polarisation of infra-red radiation by elemental bismuth;The European Physical Journal B;2020-06

3. Ellipsometric Characterization of Ag-Bi Films for Application as Epsilon-Near-Zero Materials;OSA Advanced Photonics Congress (AP) 2020 (IPR, NP, NOMA, Networks, PVLED, PSC, SPPCom, SOF);2020

4. Ellipsometric study on temperature dependent optical properties of topological bismuth film;Applied Surface Science;2017-11

5. Langmuir probe measurement of the bismuth plasma plume formed by an extreme-ultraviolet pulsed laser;Journal of Physics D: Applied Physics;2014-09-05

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