Determination of optical parameters and thickness of weakly absorbing thin films from reflectance and transmittance spectra
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Publisher
The Optical Society
Reference23 articles.
1. Determination of the thickness and optical constants of amorphous silicon
2. Determination of optical constants of thin film coating materials based on inverse synthesis
3. Improved method for determination of optical constants of organic thin films from reflection and transmission measurements
4. Determination of Optical Constants from Intensity Measurements at Normal Incidence
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