High-precision methods and devices for in situ measurements of thermally induced aberrations in optical elements-Reference-Cited by-同舟云学术

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High-precision methods and devices for in situ measurements of thermally induced aberrations in optical elements

Published:2006-06-10 Issue:17 Volume:45 Page:4092
ISSN:0003-6935
Container-title:Applied Optics
language:en
Short-container-title:Appl. Opt.

Author:

Zelenogorsky Victor V.,Solovyov Alexander A.,Kozhevatov Ilya E.,Kamenetsky Eugene E.,Rudenchik Eugene A.,Palashov Oleg V.,Silin Dmitry E.,Khazanov Efim A.

Publisher

The Optical Society

Reference17 articles.

1. Thermal lensing compensation for AIGO high optical power test facility

2. LIGO: The Laser Interferometer Gravitational-Wave Observatory

3. Sinusoidal phase modulating interferometry for surface profile measurement

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2. Thermal aberrations and structured light II: experimental simulation with DMDs;Applied Physics B;2021-07-16

3. Adaptive Gradient Estimation Stochastic Parallel Gradient Descent Algorithm for Laser Beam Cleanup;Photonics;2021-05-19

4. Thermo-optical properties of Ho:Y2O3 ceramics;Optical Materials;2020-02

5. Active lens for thermal aberration compensation in lithography lens;Applied Optics;2018-10-08

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