Characterization of integrated photonic devices with minimum phase technique
Author:
Publisher
The Optical Society
Subject
Atomic and Molecular Physics, and Optics
Reference18 articles.
1. Simple and accurate loss measurement technique for semiconductor optical waveguides
2. Use and misuse of end-facet reflections in the characterization of optical waveguide directional couplers
3. Fabry–Perot method for the characterization of integrated optical directional couplers
4. High resolution optical frequency domain reflectometry for characterization of components and assemblies
5. New Methodology to Evaluate the Performance of Ring Resonators Using Optical Low-Coherence Reflectometry
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2. Phase retrieval of programmable photonic integrated circuits based on an on-chip fractional-delay reference path;Optica;2022-12-12
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