Optical properties of an optically rough coating from inversion of diffuse reflectance measurements-Reference-Cited by-同舟云学术

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Optical properties of an optically rough coating from inversion of diffuse reflectance measurements

Published:2007-05-15 Issue:16 Volume:46 Page:3133
ISSN:0003-6935
Container-title:Applied Optics
language:en
Short-container-title:Appl. Opt.

Author:

Murphy Anthony B.

Publisher

The Optical Society

Reference32 articles.

1. Dielectric functions and optical parameters of Si, Ge, GaP, GaAs, GaSb, InP, InAs, and InSb from 1.5 to 6.0 eV

2. Spectroscopic ellipsometry of thin film and bulk anatase (TiO2)

3. Electrical and optical properties of undoped and antimony‐doped tin oxide films

4. Determination of the thickness and optical constants of amorphous silicon

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